AOpen AOI-702U Dokumentacja Pobierz pdf (Strona 131)

FA Inspector (AOI) Scanner

131 | Page

FocalSpot, Inc. | www.FocalSpot.com

Metal Electrode Face (MELF)

1 or 2 600

Very difficult due to the reflective properties and

inconsistency of the marking.

 Enable polarity

 Disable Center Alternate Templates

 Disable Color Check

Quad Flat Pack (QFP)

1 or 2 600-700

Avoid the date code, train on the model number

of the chip. If it is a long label you may need to

break up the template into two or more

“Templates”.

Ball Grid Array (BGA)

w/ Optional

Dependency

1 or 2 600-700

Small Outline Integrated Circuit (SOIC)

1 or 2 600-700

Thin Small Outline Package (TSOP)

w/ Optional

Dependency

2 or 3 600-700

CAUTION: Using a magnification of 3-4 (cam# 3-4 in the CXF file) may require lower threshold score

settings. If lower than recommended scores are used ALWAYS verify the inspection routine using a bare board

to insure that settings have not been adjusted too low (which could result in false pass for these devices).

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AOpen AOI-702U Dokumentacja Strona 131